In the design cycle of a VLSI complexity integrated circuit (IC), the post-fabrication testing phase follows the design phase. Testing is an important phase during which our goal is to ensure that the circuit behaves the way it is expected to behave. A suite of test vectors and associated expected responses are used to test the IC. Though it looks like testing should be worried about post-fabrication, the designer, in fact, must ensure the circuit testability during the design phase rather than an after-thought. In this course, you will learn the entire gamut of digital system testing issues and solutions, namely, fault modeling, fault detection, development of test-suites, automation of test vector generation, etc. By completing this course, you will
Syllabus can be found here.
| Subjects | Reading |
|---|---|
| Course Overview and Introduction | Textbook, Chapter 1 |
| Modeling |
Textbook: Section 2.1 - 2.4 Skip 2.3.3, 2.4.3 - 2.4.4 |
| Logic Simulation |
Textbook: Section 3.1 - 3.10 Skip 3.10.3, 3.10.4, |
| Fault Modeling | Textbook: Section 4.1 - 4.6 |
| Fault Simulation | Textbook: Section 5.1 - 5.2 |
| Testing for Single Stuck Faults | Textbook: Section 6.1, 6.2.1, 6.2.2, 6.3 |
| A brief introduction to Boolean Satisfiability Solving | |
| Functional Testing | Textbook: Section 8.1, 8.2.1, 8.3.1, 8.4.1 |
| Design for Testability | Textbook: Section 9.1 - 9.4 |
|
Built-In Self Test
Built-In Self Test - Introduction (video) Test Pattern Generation for BIST (video) BIST Architectures (video) |
Textbook: Section 11.1, 11.2.1 - 11.2.3 (skip 11.2.3.2, 11.2.3.4), 11.3, 11.4.1 - 11.4.4, 11.4.12 |